Apparatus and method for monitoring and predicting failures...

Details Apparatus and method for monitoring and predicting failures... Apparatus and method for monitoring and predicting failures...

2005-09-06

2005-09-06

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S421000

Reexamination Certificate

active

06940288

ABSTRACT:
An apparatus and a method for detecting high impedance failures in system interconnects. The apparatus and method may measure resistance of a connection of one or more representative sets of pins on a partitioned chip to a circuit board and determine if the measured resistance of each of the one or more representative sets of pins is less than a threshold value. The measuring step is executed while the circuit board is operating.

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patent: 6707312 (2004-03-01), Stave
patent: 2004/0012078 (2004-01-01), Hortaleza

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