Apparatus and method for measuring the shape of a three...

Optics: measuring and testing – Shape or surface configuration – By projection of coded pattern

Reexamination Certificate

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Reexamination Certificate

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06914685

ABSTRACT:
A three-dimensional measurement apparatus using multiple striped patterns and a method thereof is disclosed to take a three-dimensional measurement by projecting and transporting the multiple striped patterns having a plurality of stripes, not a single striped pattern that is projected once to the entire area of an object, according to a striped pattern shape, thereby making a faster and more precise three-dimensional measurement, cutting down the entire size, weight and manufacturing cost of the relevant three-dimensional measurement apparatus and, at the same time, reducing measurement time.

REFERENCES:
patent: 4187011 (1980-02-01), Di Matteo et al.
patent: 4269513 (1981-05-01), DiMatteo et al.
patent: 04-052509 (1992-02-01), None
patent: 05-196436 (1993-06-01), None
patent: 10-122834 (1998-05-01), None
patent: 10-197225 (1998-07-01), None
patent: 2001-0009721 (2001-02-01), None

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