Apparatus and method for measuring the IR drop free cathodic pro

Details Apparatus and method for measuring the IR drop free cathodic pro Apparatus and method for measuring the IR drop free cathodic pro

1981-04-09

1983-05-17

Tung, T.

Chemistry: electrical and wave energy

Processes and products

Electrostatic field or electrical discharge

204196, 307 95, C23F 1300

Patent

active

043839002

ABSTRACT:
An electronic circuit for measuring the IR drop free potential of a cathodically protected structure includes a shunting transistor which is periodically pulsed on to shunt or electrically connect the output lines of a rectifier to force the voltage and current delivered to a structure being cathodically protected to zero. The reference cell potential is measured during this zero or sampling time and a minimum value detected by a detector circuit which holds the value until changed in successive sampling periods. The minimum reference cell potential is then compared to a voltage corresponding to a desired reference cell potential and the difference used to generate a firing voltage for SCRs in the rectifier and thereby control its output to achieve the desired level of cathodic protection.

REFERENCES:
patent: 3634222 (1972-01-01), Stephens
patent: 4080272 (1978-03-01), Perry et al.
patent: 4080565 (1978-03-01), Polak et al.
patent: 4160171 (1979-07-01), Merrick
patent: 4255242 (1981-03-01), Freeman

Affiliated with

Also associated with

Rating

Apparatus and method for measuring the IR drop free cathodic pro does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for measuring the IR drop free cathodic pro, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for measuring the IR drop free cathodic pro will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1566002