Chemical apparatus and process disinfecting – deodorizing – preser – Analyzer – structured indicator – or manipulative laboratory... – Means for analyzing gas sample
Patent
1990-04-17
1994-08-30
Warden, Robert J.
Chemical apparatus and process disinfecting, deodorizing, preser
Analyzer, structured indicator, or manipulative laboratory...
Means for analyzing gas sample
422 88, 436 34, 436 37, 436147, 436148, 73 73, G01N 702
Patent
active
053425804
ABSTRACT:
An apparatus and method for measuring an amount of gas adsorbed on or desorbed from a solid and for analyzing and surveying reactions of a gas with a solid. Governing parameters include pressure, temperature and gas flow rate. The apparatus and method provide accurate measurement utilizing temperature programmed characterization and the volumetric method. The method is useful at both very high and very low pressures.
REFERENCES:
patent: 2753246 (1956-07-01), Shields et al.
patent: 3059478 (1962-10-01), Coggeshall et al.
patent: 3211006 (1965-10-01), Haley
patent: 3211007 (1965-10-01), Atkins
patent: 3349625 (1967-10-01), Benusa et al.
patent: 3585861 (1969-06-01), Keng
patent: 3732736 (1973-05-01), Glaude et al.
patent: 3850040 (1974-11-01), Orr et al.
patent: 4489593 (1984-12-01), Peters et al.
patent: 4496249 (1985-01-01), Lee et al.
patent: 4515751 (1985-05-01), Krieg
patent: 4528850 (1985-07-01), Witier
patent: 4566326 (1986-01-01), Lowell
patent: 4626412 (1986-12-01), Ebner et al.
patent: 4762010 (1988-08-01), Borghard et al.
patent: 4838706 (1989-06-01), Coey et al.
patent: 4856320 (1989-08-01), Bose et al.
patent: 4865996 (1989-09-01), Castleman et al.
patent: 4967591 (1990-11-01), Rouguerol et al.
patent: 4972730 (1990-11-01), Camp et al.
patent: 5009849 (1991-04-01), Ebner et al.
patent: 5016468 (1991-05-01), Jennings
patent: 5039489 (1991-08-01), Gleaves et al.
patent: 5058442 (1991-10-01), Yamanaka et al.
patent: 5109716 (1992-05-01), Ito et al.
patent: 5157960 (1992-10-01), Brehm et al.
A. Jones, et al., Temperature-Programmed Reduction for Solid Materials Characterization, Marcel Dekker, Inc., vols. 23-25, pp. 68-79.
E. Petersen, et al., Catalyst Deactivation, Marcel Dekker, Inc., vols. 23-30, pp. 99-123.
H. Boer, et al., Automatic Apparatus for Catalyst Characterization by Temperature-Programmed Reduction/Desorption/Oxidation, Rev. Sci. Instrum. 53(3), Mar. 1982, pp. 349-361.
W. Blakely, et al., New Instrumentation and Techniques to Monitor Chemical Surface Reactions on Single Crystals Over A Wide Pressure Range (10-.sup.8 -10.sup.5 Torr) in the Same Apparatus, J. Vac. Sci. Technol., vol. 13, No. 5, Sep./Oct. 1976 pp. 1091-1096.
The CDS 900 Bench-Scale Reaction System -Chemical Data Systems, Inc., 1987.
Series 4570 High Pressure/High Temperature Reactor-Stirred Reactors-Parr Instrument Co., pp. 43-47.
ChemiSorb 2800-Micromeritics (3 pages).
Autosorb-6-Automatic Volumetric Sorption Analyzer, Quantachrome Corp. (6 pages).
Catalyst Characterization -Computer-Controlled Temperature Programmed Systems-Altamira Instruments, Inc. (2 pages).
Carpenter Roebrt
Warden Robert J.
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