Apparatus and method for measuring spatially varying...

Optics: measuring and testing – Of light reflection – With diffusion

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S600000

Reexamination Certificate

active

06987568

ABSTRACT:
An apparatus and method for measuring spatially varying bidirectional reflectance distribution function and method are provided. The apparatus and method provide means to illuminate different areas of a sample at different angles of incidence and detect the angular variation of radiation emitted from the sample in response to the illumination. The apparatus includes a paraboloidal reflector for delivering the illumination and receiving the radiation emitted by the sample, a radiation source for generating a beam of collimated radiation, a beam steering device for controlling the angle of incidence with which the focused cone of light strikes the sample, and a detector to receive the collected light from the reflector.

REFERENCES:
patent: 4285597 (1981-08-01), Lamprecht et al.
patent: 4344709 (1982-08-01), Provder et al.
patent: 4360275 (1982-11-01), Louderback
patent: 4806018 (1989-02-01), Falk
patent: 4815858 (1989-03-01), Snail
patent: 4988205 (1991-01-01), Snail
patent: 5155558 (1992-10-01), Tannenbaum et al.
patent: 5196906 (1993-03-01), Stover et al.
patent: 5241369 (1993-08-01), McNeil et al.
patent: 5270794 (1993-12-01), Tsuji et al.
patent: 5371582 (1994-12-01), Toba et al.
patent: 5541413 (1996-07-01), Pearson et al.
patent: 5636633 (1997-06-01), Messerschmidt et al.
patent: 5637873 (1997-06-01), Davis et al.
patent: 5703692 (1997-12-01), McNeil et al.
patent: 5721435 (1998-02-01), Troll
patent: 5889593 (1999-03-01), Bareket
patent: 5912741 (1999-06-01), Carter et al.
patent: 5926262 (1999-07-01), Jung et al.
patent: 5991022 (1999-11-01), Buermann et al.
patent: 6075612 (2000-06-01), Mandella et al.
patent: 6100974 (2000-08-01), Reininger
Nayar, Shree K. “Catadioptric Omnidirectional Camera.” In IEEE Conference on Computer Vision and Pattern Recognition, Puerto Rico: 482-488 (1997).
Ward, Gregory J. “Measuring and Modeling Anisotropic Reflection.” Computer Graphics, 26(2): 265-272 (Jul. 1992).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for measuring spatially varying... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for measuring spatially varying..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for measuring spatially varying... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568104

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.