Apparatus and method for measuring quiescent current utilizing t

Details Apparatus and method for measuring quiescent current utilizing t Apparatus and method for measuring quiescent current utilizing t

1995-10-20

1997-09-23

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3106

Patent

active

056708920

ABSTRACT:
A process is provided for use with a semiconductor testing apparatus having a vector generator which provides a sequence of vectors to a semiconductor device at a rate responsive to a timeset, a power supply which provides current to the semiconductor device and a current monitor which measures the current provided to the device. In one specific embodiment, the process includes setting the timeset to a first rate, conditioning the device by executing a plurality of vectors at the first rate, setting the timeset to a second rate, the second rate being slower than the first rate, and measuring the quiescent current while the timeset is set to the second rate.

REFERENCES:
patent: 4631724 (1986-12-01), Shimizu
patent: 4637020 (1987-01-01), Schinabeck
patent: 5025344 (1991-06-01), Maly et al.
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5332973 (1994-07-01), Brown et al.
patent: 5371457 (1994-12-01), Lipp

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