Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-09-07
2010-10-05
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S537000, C702S187000
Reexamination Certificate
active
07809517
ABSTRACT:
A system for testing integrated circuit products and other devices under test (DUT) includes a DUT tester, which stimulates the devices under test and analyzes signals from the devices under test. A device interface board transports signals between the DUT tester and the devices under test. A test board is coupled to the device interface board and used to generate measurements associated with the devices under test, such as phase noise or phase jitter measurements. The test board could, for example, include a phase detector for detecting a phase difference between two signals and a control loop for adjusting at least one of the two signals to maintain an average of zero DC volts at an output of the phase detector. A customization module could also be used to customize the test board. The customization module could include a phase shifter, a phase-locked loop synthesizer, and/or an oscillator.
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Cosimano Edward R
National Semiconductor Corporation
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