Apparatus and method for measuring linear nanometric distances u

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01B 1114

Patent

active

057150605

ABSTRACT:
An apparatus and method is disclosed for measuring the distance between a first body having a first surface separated by a medium from a second body through the use of transmitted evanescent radiation. The first body is substantially radiation transparent and has a critical angle of total internal reflection with respect to the medium and the second body has an optically disseminative opposing surface, that is, the opposing surface inherently disseminates radiation nonspecularly, and is capable of frustrating total internal reflection when brought into close proximity with the first surface. The apparatus and method provides for directing incident radiation into the first body toward the first surface at an angle exceeding the critical angle for total internal reflection in the first body so as to transmit radiation to the optically disseminative opposing surface, measuring the intensity of the transmitted radiation disseminated by the optically disseminative opposing surface, and calculating the distance between the first surface and the optically disseminative opposing surface based on the measured intensity of the disseminated transmitted radiation. Preferably, the optically disseminative opposing surface is composed of a material having a heterogeneous or otherwise spatially varying refractive index or a material that is capable of absorbing and reemitting the transmitted radiation. The method and apparatus may be used in a preferred embodiment for testing the distance between a magnetic recording head and a recording disk.

REFERENCES:
patent: 4681451 (1987-07-01), Guerra et al.
patent: 4813782 (1989-03-01), Yagi et al.
patent: 4936676 (1990-06-01), Stauffer
patent: 5218424 (1993-06-01), Summargren
patent: 5220408 (1993-06-01), Mager
patent: 5224174 (1993-06-01), Schneider et al.
patent: 5225690 (1993-07-01), Sakai et al.
patent: 5239183 (1993-08-01), Kouno et al.
patent: 5475488 (1995-12-01), Fukuzawa et al.
patent: 5557399 (1996-09-01), de Groot
Nasser A. Frej and Dennis C. Prieve; Hindered diffusion of a single sphere very near a wall in a nonuniform force field; J. Chem. Phys. 98 (9), May 1, 1993; 1993 American Institute of Physics; pp. 7552-7564; Pittsburgh, PA.
Dennis C. Prieve, Stacy G. Bike and Nasser A. Frej; Brownian Motion of a Single Microscopic Sphere in a Colloidal Force Field; Faraday Discuss. Chem. Soc., 1990, 90; pp. 209-222; Pittsburgh, PA (no month available).
P. A. Temple; Total internal reflection microscopy: a surface inspection technique; Applied Optics, vol. 20, No. 15, Aug. 1, 1981; pp. 2656-2664; China Lake, California.
Dennis C. Prieve and John Y. Walz; Scattering of an evanescent surface wave by a microscopic dielectric sphere; Applied Optics, vol. 32, No. 9, Mar. 20, 1993; pp. 1629-1641; Pittsburgh, PA.
John Y. Walz and Dennis C. Prieve; Prediction and Measurement of the Optical Trapping Forces on a Microscopic Dielectric Sphere; 1992 American Chemical Society; pp. 3073-3082; Pittsburgh, PA (no month available).
Herman Chew, Dau-Sing Wang and Milton Kerker; Elastic scattering of evanescent electromagnetic waves; Applied Optics, vol. 18, No. 15, Aug. 1, 1979; pp. 2679-2687; Potsdam, NY.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for measuring linear nanometric distances u does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for measuring linear nanometric distances u, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for measuring linear nanometric distances u will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-667494

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.