Apparatus and method for measuring electric field by electrorefl

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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250231R, 324 96, G01J 350

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047301090

ABSTRACT:
Apparatus and method for measuring an electric field using the electroreflectance effect. The apparatus comprises sensor means and a probe positionable at the point at which the electric field is to be measured. The probe comprises a layer of en electroreflective material having first and second surfaces. An optical source signal is directed onto the probe such that reflection or transmission at the first and second surfaces produces an optical output signal. The intensity of the output signal provides a measure of the electroreflective effect and therefore a measure of the electric field. The wavelength of the source signal is selected such that the electroreflective material exhibits the electroreflective effect at that wavelength, and such that the reflectance of the layer of electroreflective material at that wavelength changes as the index of refraction of the electroreflective material changes.

REFERENCES:
patent: 4142802 (1979-03-01), Pollak et al.
patent: 4446719 (1984-05-01), Lambert
patent: 4678904 (1987-07-01), Saaski et al.
S. Nonomura, H. Okamoto, T. Nishino and Y. Hamakawa, "Electroreflectance Study of Electronic Structure in a.sup.- Si:H", Journal de Physique, Colloque C4, Supplement au numero 10, Tome 42, Oct. 1981, pp. C4-761-C4-764.
S. Nonomura, H. Okamoto and Y. Hamakawa, "Determination of the Built-in Potential in a-Si Solar Cells by Means of Electroabsorption Method", Japanese Journal of Applied Physics, vol. 21, No. 8, Aug. 1982, pp. L464-L466.
S. Nonomura, H. Okamoto, and Y. Hamakawa, "A Study of Built-in Potential in a-Si Solar Cells by Means of Back-Surface Reflected Electroabsorption", Applied Physics A: Solids and Surfaces, vol. 32, 1983, pp. 31-38.
Y. Hamakawa, "Electroreflectance and Electroabsorption", chapter 5 of vol. 21 (Hydrogenated Amorphous Silicon), Semiconductors and Semimetals, J. I. Pankove, editor, 1984, pp. 141-158.

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