Apparatus and method for measuring circuit network

Details Apparatus and method for measuring circuit network Apparatus and method for measuring circuit network

1995-03-22

1997-07-08

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Piezoelectric crystal testing

324617, G01R 2922, G01R 2728

Patent

active

056465416

ABSTRACT:
A circuit network measuring apparatus applies a measurement signal from a signal source to a device under test and measures circuit parameters of the device under test from the measurement signal and an output signal of the device under test. The apparatus includes a function which adds a frequency follow-up algorithm to a computer control portion to vary the output frequency of the signal source, thereby performing control such that the measured value will substantially equal a given value.

REFERENCES:
patent: 3327207 (1967-06-01), Norwich
patent: 4481464 (1984-11-01), Noguchi et al.
patent: 4816743 (1989-03-01), Harms et al.
patent: 5363052 (1994-11-01), McKee
Modular Crystal Test System Model MCT Data Sheet, pp. 18 and 20, Transat Corp. (date unavailable).
"Accuracy Enhancement Fundamentals--Characterizing Microwave Systematic Errors", HP 8753C Network Analyzer Operating Manual, Reference Section Appendix 2, Chap. 5, pp. 53-64 (date unavailable).

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