Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-07-11
2000-05-02
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, G01B 902
Patent
active
060579196
ABSTRACT:
In an optical pulse characteristic measuring apparatus, optical pulses to be measured are introduced at the incident end, and split at an beam splitter. A first resultant light beam is reflected by a mirror as a local oscillation light of homodyne detection and is adjusted in a delay element so as to have the same optical path length as that of the second resultant light beam. Subsequently, the first light beam is led to an optical mixer. The second light beam is reflected by a mirror, which is controlled by a signal from a signal generator for modulation of optical path length difference. The second light beam is then reflected by a delay element and is led to the optical mixer. The two light beams combined at the optical mixer are detected by optical detectors. The AC signal component generated by modulation of the optical path length difference is amplified up to a measurable voltage by a differential amplifier. A bandpass filter passes only the AC signal component generated by modulation of the optical path length difference, thereby improving the S-N ratio. By using an AC voltmeter to measure the AC signal component corresponding to the delay of the delay element for correlation length measurement, the auto-correlation signal can be obtained. Accordingly, it is possible to measure the characteristics of optical pulses with high sensitivity and high stability.
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Jiang Shudong
Machida Susumu
Yamamoto Yoshihisa
Japan Science and Technology Corporation
Kim Robert H.
Lee Andrew H.
Yoshihisa Yamamoto
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