Apparatus and method for measuring capacitance from the duration

Details Apparatus and method for measuring capacitance from the duration Apparatus and method for measuring capacitance from the duration

1993-09-17

1995-10-24

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

320 1, G01R 2726

Patent

active

054613213

ABSTRACT:
A highly accurate system to measure the value of a capacitor using proportionality against a time base reference. The capacitor under test is linearly sequentially charged in three discrete steps yielding integrated net neutral charge as well as a delay for discharging dielectric absorption during each measurement cycle.

REFERENCES:
patent: 3778708 (1973-12-01), Anders et al.
patent: 3993947 (1976-11-01), Maltby et al.
patent: 4146834 (1979-03-01), Maltby et al.
patent: 4499766 (1985-02-01), Fathauer et al.
patent: 4558274 (1985-12-01), Carusillo
patent: 4939519 (1990-07-01), Elbert
patent: 5045797 (1991-09-01), Kramer et al.
patent: 5278513 (1994-01-01), Kramer et al.
patent: 5294889 (1994-03-01), Heep et al.

Affiliated with

Also associated with

Rating

Apparatus and method for measuring capacitance from the duration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for measuring capacitance from the duration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for measuring capacitance from the duration will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1889135