Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate
2005-05-24
2005-05-24
Smith, Zandra V. (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
C356S400000
Reexamination Certificate
active
06897956
ABSTRACT:
An apparatus for measuring an alignment accuracy between overlaid alignment marks formed to each of alignment mark portions on every plural chip units or exposure units arranged on a substrate to be measured, comprising: an XY stage running in a direction x and in a direction y while mounting the substrate; an illumination optical system for illuminating each of the alignment mark portions in a state where the XY stage runs in a direction x which is a direction of arranging the chips; a detecting optical system having an objective lens for collecting a reflection light in the running state obtained from the overlaid alignment marks, a focusing optical system for focusing the reflection light in the running state obtained from the objective lens, a scanning optical system for scanning reflection light image in the running state focused by the focusing optical system in a direction opposite to that of the running and a linear image sensor receiving reflection light image substantially in a static state being scanned in the opposite direction by the scanning optical system and converting them into image signal; and an alignment accuracy calculation device for measuring the alignment accuracy between the overlaid alignment marks at least for a direction perpendicular to the running direction based on the image signal converted by the linear image sensor.
REFERENCES:
patent: 6088113 (2000-07-01), Kim
patent: 6331885 (2001-12-01), Nishi
Maeda Shunji
Nakada Masahiko
Nakata Toshihiko
Noguchi Minori
Suzuki Takahiko
Hitachi High-Tech Electronics Engineering Co., Ltd.
Smith Zandra V.
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