Apparatus and method for measuring absolute measurements having

Optics: measuring and testing – By particle light scattering – With photocell detection

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356358, G01B 902, G01B 1102

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055217044

ABSTRACT:
An apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser emitting a laser beam. The two measuring interometers each have their own measuring lines and are supplied with the beam from one and the same laser. A reference line is established from the arithmetic sum or difference of the two measuring lines and is maintained at a constant value.

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patent: 4984898 (1991-01-01), Hofler et al.
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patent: 5301010 (1994-04-01), Jones et al.

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