Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-05-02
1996-05-28
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, G01B 902, G01B 1102
Patent
active
055217044
ABSTRACT:
An apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser emitting a laser beam. The two measuring interometers each have their own measuring lines and are supplied with the beam from one and the same laser. A reference line is established from the arithmetic sum or difference of the two measuring lines and is maintained at a constant value.
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Franz Andreas
Michel Dieter
Thiel Jurgen
Eisenberg Jason D.
Turner Samuel A.
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