Geometrical instruments – Gauge – Internal
Reexamination Certificate
2001-10-23
2003-10-28
Gutierrez, Diego (Department: 2859)
Geometrical instruments
Gauge
Internal
C033S552000
Reexamination Certificate
active
06637123
ABSTRACT:
FIELD OF THE INVENTION
This invention relates to measuring gauges in general. More specifically this invention relates to gauges that are used on automated assembly lines to rapidly determine specified dimensions of an item of interest or work piece.
BACKGROUND OF THE INVENTION
Probing gauges are generally known in the prior art. Multi tipped probes are commonly utilized as a measuring instrument. However, they often require a common stylus and therefore cannot operate independently. Instead, the single stylus is employed to take measurements individually, albeit in a rather rapid serial fashion. Other probes, with separate styli for each point of interest are also known. However, such devices are ill suited to the high volume, high pace and rapid measuring requirements of an automated assembly line with gauging of each part.
Because it is desired in automotive assembly operations to determine precise measurements on various components, rapid data collection on every part that passes a given assembly station is vital. For example, in assembling a vehicle differential assembly to a drive shaft, it is critically important to determine measurements of certain features of the differential and drive shaft so that the appropriate shim set may be inserted in the assembly.
One such desired measurement is the axial center of a curved feature on the differential. Prior art attempts to reliably and rapidly determine this desired measurement on each and every assembly in a given workstation have fallen short of the desired goals. Representative examples of the prior art are now discussed.
Chapman (U.S. Pat. No. 3,197,879) describes a gauge for determining the equator of a spherical cavity using a plurality of balls connected to plunger assemblies. Specifically, three balls are used as contacting elements. The balls are part of a respective plunger assembly, and the balls are positioned in respective recesses in the gauge. Each ball respectively is in communication with a shaft assembly. The shaft assembly resists axial movement and only permits longitudinal displacement. A membrane at the distal port of the shaft assembly is subject to movement as the shaft is displaced due to contact of the ball-contacting element with the spherical cavity of interest. A transducer is used to register the displacement.
Walsh (U.S. Pat. No. 3,315,367) describes an apparatus that is manually positioned over a generally spherical work piece of interest. A contact probe with three contact points that are perpendicular to the longitudinal axis of the apparatus may be advanced to engage the selected surface. The probe is adapted to measure concave and convex surfaces. Each contact point is a ball that is in communication with a spring and a shaft, and ultimately to an electronic signal that is relayed to a processor.
Albertazzi (U.S. Pat. No. 4,355,467) describes a gauge and method for checking the contoured portions of a constant velocity (CV) joint. The center of an equatorial plane is constructed from electronic input collected from twenty-four (24) sensing contacts. The sensing contacts are feelers that are connected to corresponding arms, which are arranged in sets. Each arm-set, in turn, is coupled to a block through two perpendicular flat springs by screws. Ultimately, transducers register the displacement of the feelers when said feelers contact the feature of a given CV joint.
Niewmierzycki (U.S. Pat. No. 5,452,521) describes an apparatus and method for detecting and correcting the eccentricity and angular misalignment of a wafer. Using at least four points measured by a plurality of sensors, a microprocessor accurately determines the position of the wafer while on a robot arm. The wafer is substantially circular and flat. The sensors are located around the wafer's edge so to allow each sensor to instantaneously determine the position of a point on the edge. The sensor requires the wafer to be stationary, but uses non-contacting sensors to determine each position. The microprocessor calculates the center of the wafer and compares its calculations to a reference. The information computed in the microprocessor then triggers the robot to adjust the position of the wafer. Two rotatable shafts correct the eccentricity and angular misalignment in a single movement.
Moschner (U.S. Pat. No. 4,653,196) describes a device for measuring a plurality of offset bores that share a common axis. The device uses a plurality of contact sensors linked to a computer.
Baun (U.S. Pat. No. 4,563,824) describes an apparatus for centering a disk of varying sizes. Three contacting probes push and determine the location of three respective points on the disk. The probes, controlled by a computer, can manipulate the disk in a limited range of motion.
Watanabe (U.S. Pat. No. 4,447,959) describes an apparatus for determining the inner diameter of a bore using two contact probes.
Possati (U.S. Pat. No. 3,808,696) describes a method and apparatus for determining the dimensions of a work piece comprising of two pairs of contact sensors linked to respective transducers and a processing unit.
Although the above-identified prior art is generally successful for determining measurements of spherical or otherwise curvilinear surfaces, they are limited in their ability to rapidly collect data necessary to determine the contour of interest in an environment that demands high-speed acquisition and repeated use.
Therefore, there exists a need for a gauge for use in a high-speed production environment to measure a contoured surface in rapid and repeated fashion. Moreover, it is desirable for such a gauge to be compact in design, simple to operate, repair and replace components, when necessary.
SUMMARY OF THE INVENTION
The present gauge incorporates three contact sensors that use a plurality of balls to transfer radial displacement to a coordinate measurement system. The present invention provides a compact design. The arrangement of contacting probes in a single head that nearly simultaneously, but independently, contacts the surface of interest, coupled with sensors, such as digital probes and known calculating means, results in a device that is well suited for accurate measurement of the feature of interest in an automated, high-speed production environment.
A specific embodiment of the present invention is a dynamic probing gauge used in an automated assembly line to verify an origin, also called a center point, of a curved feature such as, a concave semi-circle. In a particular embodiment, the invention measures the origin in two dimensions, that is, an x-coordinate and a y-coordinate. The gauge has a housing that is generally contoured to the mating shape of reference surface of the workpiece, for example a vehicle differential assembly. To define the origin of a circle, a minimum of three probing points are required. Accordingly, an embodiment of the present invention uses three probes positioned on the housing to simultaneously, but independently measure three defining points of a presumed circle.
As a general overview of the specific invention, the following process flow is illustrative of the invention. An automotive differential is loaded on a pallet so that the feature of interest is at the top. The pallet enters the shim selection station, which is fully automated. The differential is unloaded from the pallet and the station then verifies the dimension of interest by lowering the probe with its three contact points into the feature, which is a concave semi-circular opening. When each probe point makes positive contact with the surface of the concave semi-circle, a signal is sent to a central processor. The triggering event occurs when the last probe, of the three, makes contact with the opening. At that instant, the probe registers the x and y and z coordinates of each probe tip, and then calculates the diameter of the curved surface. This information is translated into a shim set and communicated to the operator at the following station. The operator then matches the correct shim set to the specific differential.
The housing f
Deir Peter J.
McGillis Daniel W.
Rucha Robert J.
ABB Inc.
Cohen Amy R.
Ryan Kromholz & Manion S.C.
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