Apparatus and method for material treatment and inspection using

Electric heating – Metal heating – By arc

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

21912161, 21912176, 2191218, B23K 2602, B23K 2608

Patent

active

055804713

ABSTRACT:
Apparatus and method for the precision treatment of a material using a semiconductor diode for generating a plurality of laser light beams, optical fibers coupled to the diode for transmitting and combining the light beams, and a scanner for scanning the combined light beams onto the material to be treated. Also, channels micromachined onto a fixture are provided for supporting the fibers in optimum alignment with the diode. Also provided are a camera and a thermal image capturing system for generating optical and thermal images of the material. An image processing unit is provided for receiving and processing the image to generate and transmit control signals to a diode controller to control intensity and timing of the light beams, and to a controller of the scanner to control positioning of the scanner to deflect the laser beam over the material as desired.

REFERENCES:
patent: 3803413 (1974-04-01), Vanzetti et al.
patent: 4481418 (1984-11-01), Vanzetti et al.
patent: 4531044 (1985-07-01), Chang
patent: 4657169 (1987-04-01), Dostoomian et al.
patent: 4696101 (1987-09-01), Vanzetti et al.
patent: 4696104 (1987-09-01), Vanzetti et al.
patent: 4787696 (1988-11-01), Norris et al.
patent: 4812002 (1989-03-01), Kato et al.
patent: 4893742 (1990-01-01), Bullock
patent: 4914272 (1990-04-01), Ito et al.
patent: 4963714 (1990-10-01), Adamski et al.
patent: 4998005 (1991-03-01), Rathi et al.
patent: 5023426 (1991-06-01), Prokosch et al.
patent: 5055652 (1991-10-01), Jones et al.
patent: 5122635 (1992-06-01), Knodler et al.
patent: 5216729 (1993-06-01), Berger et al.
patent: 5233152 (1993-08-01), Prokosch et al.
patent: 5311535 (1994-05-01), Karpinski
patent: 5337392 (1994-08-01), Mousseaux et al.
patent: 5373526 (1994-12-01), Lam et al.
Akira Fukumoto and Heijiro Hayami, "Laser Display Systems--They're Not Practical Yet But Their Acousto-optic Beam Deflectors Are," J. of Electronics Engineering, p. 40 (1975 Aug.).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for material treatment and inspection using does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for material treatment and inspection using, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for material treatment and inspection using will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-782556

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.