Apparatus and method for mapping lateral variation of subsurface

Details Apparatus and method for mapping lateral variation of subsurface Apparatus and method for mapping lateral variation of subsurface

1994-03-29

1996-05-07

McElheny, Jr., Donald E.

Boots, shoes, and leggings

364422, G06F 1900

Patent

active

055152716

ABSTRACT:
A technique for mapping lateral impedance of a subsurface layer is disclosed. Amplitudes are selected along a lateral slice of seismic data and an impedance model that generates values which approximate the selected amplitudes is developed. The lateral impedance of the subsurface layer is determined from the model and is mapped laterally, to produce a visual representation of the lateral impedance.

REFERENCES:
patent: 4228529 (1980-10-01), Hsu et al.
patent: 4293933 (1981-10-01), Park et al.
patent: 4679174 (1987-07-01), Gelfand
patent: 5001677 (1991-03-01), Masters
Russell, B., "Introduction to Seismic Inversion Methods", Society of Exploration Geophysicists (SEG), Course Notes Series, vol. 2, ISBN-0-931830-65-6 1988, part 12.

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