Apparatus and method for manufacturing integrated circuit device

Semiconductor device manufacturing: process – Including control responsive to sensed condition

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438 14, H01L 2100

Patent

active

061366145

ABSTRACT:
The present invention is directed to a control system for a photolithographic integrated circuit manufacturing process. The control system incorporates a visual gating device in which a series of nests are provided. A barcode reader may be provided in conjunction with some of the nests. In operation, a human operator advances wafer lot boxes through the nest positions in accordance with a series of displays which are controlled by the control system. The barcode reader associated with each nest reads a barcode label on the wafer lot box contained within the nest to determine the lot number corresponding to the lot box. This lot number is then used by the control system to obtain setup parameters for the various photolithographic manufacturing process operations.

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