Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Patent
1974-08-19
1976-02-17
Chatmon, Jr., Saxfield
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
324 57DE, 324181, 324161, 324185, 324188, G01R 2700
Patent
active
039394050
ABSTRACT:
An apparatus and method is described for automatically measuring the rate of decay of oscillation in mechanical structures, acoustical enclosures, and electrical circuits which have been suitably excited. The apparatus includes a source of excitation energy being applied by a transducer to one point to produce oscillation in the form of vibrations, sound, or electrical pulsations. To initiate measurement, the excitation is terminated, a dual trace oscilloscope is triggered, a data processing circuit is operationalized, and a reference decay rate signal is generated. A pickup transducer at a second point converts the decaying oscillation into an input signal which the data processing circuit absolute-values and log-converts to provide a decaying data signal for display as a slope on the oscilloscope. The reference decay rate signal is generated from an adjustable reference signal by integration and is displayed as a slope on the oscilloscope. By adjusting the reference signal, the reference decay rate signal slope is adjusted to match the slope of the decaying data signal and then the rate of decay which is the value of the slope is determined directly from the value of the reference signal.
REFERENCES:
patent: 2623106 (1952-12-01), Fassberg
patent: 3107329 (1963-10-01), McSkimin
patent: 3156865 (1964-11-01), Lamont
patent: 3505598 (1970-04-01), Merrill
patent: 3519849 (1970-07-01), Tyler
patent: 3675047 (1972-07-01), Vahlstrom et al.
patent: 3718857 (1973-02-01), Bernard
patent: 3735261 (1973-05-01), Vahlstrom et al.
Chatmon, Jr. Saxfield
Deere & Company
LandOfFree
Apparatus and method for making decay rate measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for making decay rate measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for making decay rate measurements will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1748021