Apparatus and method for ion production enhancement

Details Apparatus and method for ion production enhancement Apparatus and method for ion production enhancement

2006-11-14

2006-11-14

Wells, Nikita (Department: 2881)

Radiant energy

Ion generation

With sample vaporizing means

C250S42300F

Reexamination Certificate

active

07135689

ABSTRACT:
The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

REFERENCES:
patent: 4098589 (1978-07-01), Buswell et al.
patent: 4531056 (1985-07-01), Labowsky et al.
patent: 4766741 (1988-08-01), Bartlett et al.
patent: 4796433 (1989-01-01), Bartlett
patent: 4968885 (1990-11-01), Willoughby
patent: 5022379 (1991-06-01), Wilson, Jr.
patent: 5208458 (1993-05-01), Busch et al.
patent: 5285064 (1994-02-01), Willoughby
patent: 5498545 (1996-03-01), Vestal
patent: 5560216 (1996-10-01), Holmes
patent: 5825026 (1998-10-01), Baykut
patent: 5869832 (1999-02-01), Wang et al.
patent: 5917185 (1999-06-01), Yeung et al.
patent: 5962851 (1999-10-01), Whitehouse et al.
patent: 5965884 (1999-10-01), Laiko et al.
patent: 6040575 (2000-03-01), Whitehouse et al.
patent: 6107626 (2000-08-01), Wang et al.
patent: 6140639 (2000-10-01), Gusev et al.
patent: 6154608 (2000-11-01), Rochelle
patent: 6175112 (2001-01-01), Karger et al.
patent: 6204500 (2001-03-01), Whitehouse et al.
patent: 6479828 (2002-11-01), Perel
patent: 6504150 (2003-01-01), Verentchikov et al.
patent: 6627883 (2003-09-01), Wang et al.
patent: 6646257 (2003-11-01), Fischer et al.
patent: 6657191 (2003-12-01), Park
patent: 6825462 (2004-11-01), Truche et al.
patent: 6838663 (2005-01-01), Coon et al.
patent: 6858841 (2005-02-01), Truche et al.
patent: 6906324 (2005-06-01), Wang et al.
patent: 7091483 (2006-08-01), Fischer et al.
patent: 2002/0121598 (2002-09-01), Park
patent: 2003/0160165 (2003-08-01), Truche et al.
patent: 2003/0160167 (2003-08-01), Truche et al.
patent: 2004/0217277 (2004-11-01), Goodley et al.
patent: 2004/0227072 (2004-11-01), Park
patent: 2005/0035287 (2005-02-01), Jolliffe et al.
patent: 2005/0056776 (2005-03-01), Willoughby et al.
patent: 2005/0072918 (2005-04-01), Truche et al.
patent: 2005/0077464 (2005-04-01), Truche et al.
patent: 2005/0098722 (2005-05-01), Truche et al.
patent: 2005/0151090 (2005-07-01), Truche et al.
patent: 2005/0151091 (2005-07-01), Truche et al.
patent: 2005/0161613 (2005-07-01), Truche et al.
patent: 2005/0167587 (2005-08-01), Guevremont et al.
patent: 2005/0194530 (2005-09-01), Thakur
patent: 2005/0211911 (2005-09-01), Fischer et al.
patent: 2005/0274905 (2005-12-01), Joyce et al.
patent: 2227392 (1974-01-01), None
Agilent Technologies, Agilent 1100 Series, at http://www.chem-agilent.com/Scripts/PDS.asp?1 Page (Apr. 14, 2001).
Burle, 5902 Magnum Electron Multiplier, at http://www.burle.com/pdf/5902mag.pdf.
Ryan M. Danell et al. “Heating to Maximize AP-MALDI Performance: Evidence for Desolvation,” May 17-31, 2001.
Victor V. Laiko et al. “Atmospheric Pressure MALDI/Ion Trap Mass Spectrometry,” Anal. Chem., 2000, p. 5239-5243.
Victor V. Laiko et al. “Atmospheric Pressure Matrix-Asssisted Laser Desorption/Ionization Mass Spectrometry,” Anal. Chem. 2000, p. 652-657.

Affiliated with

Also associated with

No associations

Rating

Apparatus and method for ion production enhancement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for ion production enhancement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for ion production enhancement will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3650251