Apparatus and method for ion production enhancement

Details Apparatus and method for ion production enhancement Apparatus and method for ion production enhancement

2006-07-18

2006-07-18

Lee, John R. (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

C250S281000, C250S282000

Reexamination Certificate

active

07078682

ABSTRACT:
The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

REFERENCES:
patent: 4098589 (1978-07-01), Buswell et al.
patent: 4531056 (1985-07-01), Labowsky et al.
patent: 4766741 (1988-08-01), Bartlett et al.
patent: 4796433 (1989-01-01), Bartlett
patent: 4968885 (1990-11-01), Willoughby
patent: 5022379 (1991-06-01), Wilson, Jr.
patent: 5208458 (1993-05-01), Busch et al.
patent: 5285064 (1994-02-01), Willoughby
patent: 5290761 (1994-03-01), Keating et al.
patent: 5498545 (1996-03-01), Vestal
patent: 5552600 (1996-09-01), Davies et al.
patent: 5560216 (1996-10-01), Holmes
patent: 5825026 (1998-10-01), Baykut
patent: 5869832 (1999-02-01), Wang et al.
patent: 5917185 (1999-06-01), Yeung et al.
patent: 5962851 (1999-10-01), Whitehouse et al.
patent: 5965884 (1999-10-01), Laiko et al.
patent: 6040575 (2000-03-01), Whitehouse et al.
patent: 6107626 (2000-08-01), Wang et al.
patent: 6140639 (2000-10-01), Gusev et al.
patent: 6154608 (2000-11-01), Rochelle
patent: 6175112 (2001-01-01), Karger et al.
patent: 6204500 (2001-03-01), Whitehouse et al.
patent: 6291821 (2001-09-01), Danylewych-May et al.
patent: 6479828 (2002-11-01), Perel
patent: 6486469 (2002-11-01), Fischer et al.
patent: 6504150 (2003-01-01), Verentchikov et al.
patent: 6534765 (2003-03-01), Robb et al.
patent: 6583407 (2003-06-01), Fischer et al.
patent: 6627883 (2003-09-01), Wang et al.
patent: 6646257 (2003-11-01), Fischer et al.
patent: 6657191 (2003-12-01), Park
patent: 6661003 (2003-12-01), Fischer et al.
patent: 6825462 (2004-11-01), Truche et al.
patent: 6858841 (2005-02-01), Truche et al.
patent: 6906324 (2005-06-01), Wang et al.
patent: 2003/0160165 (2003-08-01), Truche et al.
patent: 2003/0160167 (2003-08-01), Truche et al.
patent: 2004/0217277 (2004-11-01), Goodley et al.
patent: 2005/0035287 (2005-02-01), Jolliffe et al.
patent: 2005/0072918 (2005-04-01), Truche et al.
patent: 2005/0077464 (2005-04-01), Truche et al.
patent: 2005/0098722 (2005-05-01), Truche et al.
patent: 2005/0151090 (2005-07-01), Truche et al.
patent: 2005/0151091 (2005-07-01), Truche et al.
patent: 2005/0161613 (2005-07-01), Truche et al.
patent: 2005/0194530 (2005-09-01), Thakur
patent: 2006/0054805 (2006-03-01), Flanagan et al.
patent: 2006/0065827 (2006-03-01), Yang et al.
patent: 2006/0065828 (2006-03-01), Lu et al.
patent: 2227392 (1974-01-01), None
Agilent Technologies, Agilent 1100 Series, at http://www.chem-agilent.com/Scripts/PDS.asp?1Page (Apr. 14, 2001).
Burle, 5902 Magnum Electron Multiplier, at http://www.burle.com/pdf/5902mag.pdf.
Ryan M. Danell et al. “Heating to Maximize AP-MALDI Performance: Evidence for Desolvation,” May 17-31, 2001.
Victor V. Laiko et al. “Atmospheric Pressure MALDI/Ion Trap Mass Spectrometry,” Anal. Chem., 2000, p. 5239-5243.
Victor V. Laiko et al. “Atmospheric Pressure Matrix-Assisted Laser Desorption/Ionization Mass Spectrometry,” Anal. Chem. 2000, p. 652-657.

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