Apparatus and method for interferometric measurements

Details Apparatus and method for interferometric measurements Apparatus and method for interferometric measurements

1997-07-14

1999-06-08

Font, Frank G.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356364, G01B 902

Patent

active

059108401

ABSTRACT:
A light source supplies light to an interferometer or polarimetric sensor and a beam divider divides the emerging light into two or more beam paths. Interference filters having different central wavelengths are provided in the beam paths and can be used to bring the two uncoupled interference signals into quadrature, e.g. by suitable adjustment of the tilting angle. In each beam path, a measuring device for quantitatively measuring the received light is disposed, and the data from the measuring devices are supplied to a data-processing device.

REFERENCES:
patent: 4708475 (1987-11-01), Watson
patent: 5223911 (1993-06-01), Suchoski, Jr. et al.
patent: 5675415 (1997-10-01), Akatsu et al.
Katherine Creath, Appl. Optics 26, 2810 (1987).
Peter de Groot and Stanley Kishner, Appl. Optics 30, 4026 (1991).
D.A. Jackson, Meas. Sci. Technol. 5, 621 (1994).

Affiliated with

Also associated with

Rating

Apparatus and method for interferometric measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for interferometric measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for interferometric measurements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1685927