Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-07-19
2011-07-19
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C351S221000
Reexamination Certificate
active
07982881
ABSTRACT:
A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.
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Fercher Adolf Friedrich
Leitgeb Rainer
Carl Zeiss Meditec AG
Lyons Michael A
Patterson Thuente Christensen Pedersen , P.A.
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