Apparatus and method for integrated circuit test analysis

Details Apparatus and method for integrated circuit test analysis Apparatus and method for integrated circuit test analysis

1979-01-26

1980-12-30

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324 96, 350331R, 350347E, G01R 3122

Patent

active

042426359

ABSTRACT:
An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded.

REFERENCES:
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 3934199 (1976-01-01), Channin

Affiliated with

Also associated with

Rating

Apparatus and method for integrated circuit test analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for integrated circuit test analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for integrated circuit test analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-9529