Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-01-11
2011-01-11
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07868644
ABSTRACT:
A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.
REFERENCES:
patent: 5459410 (1995-10-01), Henley
patent: 5793221 (1998-08-01), Aoki
patent: 6973209 (2005-12-01), Tanaka
Eom Soung Yeoul
Kang Dong Woo
Kim Bong Chul
Yang Ki Soub
Brinks Hofer Gilson & Lione
LG Display Co. Ltd.
Nguyen Ha Tran T
Nguyen Tung X
LandOfFree
Apparatus and method for inspecting liquid crystal display does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for inspecting liquid crystal display, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for inspecting liquid crystal display will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2735735