Apparatus and method for inspecting interface between ground...

Details Apparatus and method for inspecting interface between ground... Apparatus and method for inspecting interface between ground...

2007-01-30

2007-01-30

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S765010, C324S633000, C324S635000

Reexamination Certificate

active

10917822

ABSTRACT:
An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.

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“Design of lowpass filters using defected ground structure and compensated microstrip line”, Electronics Letters, Oc. 24, 2002, vol. 38, No. 2 pages.

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