Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-20
2005-09-20
Tsai, Carol S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S062000, C702S064000, C702S065000, C702S069000, C702S074000, C702S075000, C324S1540PB
Reexamination Certificate
active
06947853
ABSTRACT:
The present invention provides an apparatus and method for inspecting electrical continuity of a circuit board, capable of decreasing the impedance in a current path as an inspection object to achieve enhanced SN ratio. A coupling capacitance is formed at one of terminals of a pattern wire on a board as an inspection object in a non-contact manner, and an inductance (450) and a lead wire are connected to this capacitance. An AC inspection signal is applied to the other terminal through the lead wire in a contact manner. A resonance circuit is defined by the capacitance, inductance and pattern wire, and thereby an output signal can be detected with lowering the impedance.
REFERENCES:
patent: 3975680 (1976-08-01), Webb
patent: 4819322 (1989-04-01), Higuchi et al.
patent: 5254953 (1993-10-01), Crook et al.
patent: 5621327 (1997-04-01), Chiang et al.
patent: 5696451 (1997-12-01), Keirn et al.
patent: 5883437 (1999-03-01), Maruyama et al.
patent: 6027500 (2000-02-01), Buckles et al.
patent: 6097202 (2000-08-01), Takahashi
patent: 6111414 (2000-08-01), Chatterjee et al.
patent: 6201398 (2001-03-01), Takada
patent: 6249114 (2001-06-01), Sakai
patent: 6353327 (2002-03-01), Nishikawa
patent: 6650126 (2003-11-01), Indihar
patent: 6703849 (2004-03-01), Ishioka et al.
patent: 6734692 (2004-05-01), Fujii et al.
patent: 60-117744 (1985-06-01), None
patent: 62-257070 (1987-11-01), None
patent: 02302679 (1990-12-01), None
patent: 04-244976 (1992-09-01), None
patent: 05299072 (1993-11-01), None
patent: 07-146323 (1995-06-01), None
patent: 10-115653 (1998-05-01), None
patent: 2000-155149 (2000-06-01), None
patent: 2000-171500 (2000-06-01), None
Search report dated Jul. 11, 2000.
OHT Inc.
Tsai Carol S.
Westerman Hattori Daniels & Adrian LLP
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