Measuring and testing – Probe or probe mounting
Patent
1990-09-14
1991-11-19
Raevis, Robert
Measuring and testing
Probe or probe mounting
G01R 3300
Patent
active
050656350
ABSTRACT:
An apparatus for inspecting an item having grooves machined therein includes a main housing having longitudinal grooves formed in opposite sides thereof. The main housing defines an underside for contacting the item to be inspected. A carriage has opposite sides adapted for slidably engaging the longitudinal grooves in the main housing. A sensor is provided for inspecting the item. A mechanism is provided for connecting the sensor to the carriage such that the sensor extends beyond the underside of the main housing. The mechanism is adjustable so that the degree of extension of the sensor beyond the underside of the main housing may be controlled. A reference member is adjustably connected to, and extends from, the underside of the main housing for enabling the main housing to smoothly follow each groove.
REFERENCES:
patent: 4368642 (1983-01-01), Carodiskey
patent: 4375165 (1983-03-01), de Sterke
patent: 4528856 (1985-07-01), Junker et al.
patent: 4746858 (1988-05-01), Metala et al.
patent: 4788499 (1989-11-01), Meier et al.
patent: 4848165 (1989-07-01), Bartilson et al.
patent: 4879088 (1989-11-01), van Swam et al.
Burtner Lee W.
Chizmar David A.
Bach K.
Raevis Robert
Westinghouse Electric Corp.
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