Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-10
2007-04-10
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
11106651
ABSTRACT:
An apparatus and method for inspecting a liquid crystal display device is provided. The apparatus includes: a camera photographing a front surface of a liquid crystal panel; a back light irradiating light to the liquid crystal panel; a diffuser sheet diffusing the light generated from the back light; a prism sheet converting the diffused light so as to be perpendicularly incident to a rear surface of the liquid crystal panel; a probe unit applying an inspection signal to the liquid crystal panel; and a frequency converter converting a frequency of the light generated from the back light. The apparatus for inspecting the liquid crystal display device according to the invention detects bad sub-pixels, impossible to detect with the naked-eye, improving the quality of the liquid crystal display device.
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Office action issued from the Taiwan Patent Office on Mar. 7, 2006.
Byun Sung Nam
Chung Han Rok
Hollington Jermele
LG. Philips LCD Co. Ltd.
McKenna Long & Aldridge LLP
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