Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-02-22
2005-02-22
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S1540PB
Reexamination Certificate
active
06859062
ABSTRACT:
The present invention provides an inspection apparatus and inspection method capable of inspecting the shape of a board used in a liquid crystal panel with high fineness and efficiency. A computer21controls an X-electrode select section22and a Y-electrode select section23to drive liquid crystal driving electrodes102selectively. A FLASHSHOCK Sensor1is located at a position opposed to a board100in a non-contact manner. The FLASHSHOCK Sensor1is adapted to detect each potential variation caused in the liquid crystal electrodes101-104and then output the detected potential variation to the computer21as a detect signal. The computer21receives the detect signal from the FLASHSHOCK Sensor1to create image data, and detects disconnection, short-circuit, chipping or the like in the liquid crystal electrodes based on the created image data. Further, the computer21displays an image representing each shape of the liquid crystal electrodes on a display21a.
REFERENCES:
patent: 4870357 (1989-09-01), Young et al.
patent: 5258705 (1993-11-01), Okamoto et al.
patent: 5311137 (1994-05-01), Chang et al.
patent: 5614839 (1997-03-01), Bosacchi
Fujii Tatuhisa
Ishioka Shogo
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