Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2009-10-15
2010-12-21
Dang, Hung X (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S206000, C351S221000, C351S246000
Reexamination Certificate
active
07854510
ABSTRACT:
A slit lamp mounted eye imaging device for viewing wide field and/or magnified views of the retina or the anterior segment through an undilated or dilated pupil. The apparatus images posterior and anterior segments of the eye, and sections/focal planes in between and contains an illumination system that uses one or more LEDs, shifting optical elements, and/or aperture stops where the light can be delivered into the optical system on optical axis or off axis from center of optical system and return imaging path from the retina, thereby creating artifacts in different locations on retina. Image processing is employed to detect and eliminate artifacts from images. The device is well suited for retinal imaging through an undilated pupil, non-pharmacologically dilated, or a pupil as small as 2 mm. Two or more images with reflection artifacts can be created and subsequently recombined through image processing into a composite artifact-free image.
REFERENCES:
patent: 5220360 (1993-06-01), Verdooner et al.
patent: 5993001 (1999-11-01), Bursell et al.
patent: 7118217 (2006-10-01), Kardon et al.
Leach Steven
Verdooner Steven Roger
Dang Hung X
Ries Michael
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