Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1992-08-24
1994-08-23
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 731, 371 62, G01R 3128
Patent
active
053410912
ABSTRACT:
A testing system for testing electronic parts allows coexistence of the complicated control of signal generation and measurement and the time management thereof, enables a testing of a DUT under an environment close to that of a real operating environment and improves reliability of the testing. Slave subsystems are operated under control and management of a master subsystem. Control signal synchronizing means synchronize control signals from the master subsystem with one of master clocks MCLK1 and MCLK2, and outputs the synchronized control signal to the slave subsystems through clock distribution means. The clock distribution means is controlled such that master clock whose timing is identical with the synchronized control signal is input to each slave subsystem.
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Hewlett--Packard Company
Nguyen Vinh
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