Apparatus and method for extracting edges and lines

Details Apparatus and method for extracting edges and lines Apparatus and method for extracting edges and lines

1989-03-27

1992-01-14

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 56, G06K 900

Patent

active

050816896

ABSTRACT:
An apparatus and method for processing image data to derive edges and line segments. Image intensity data is processed in one dimension along a series of scan lines to produce an intensity curve (10). Pairs of points along a scan line curve (10) representing curvature extrema (20) are checked to determine if the intensity difference between the curvature extrema (20) are characteristic of edges. Edge points are then determined between pairs of curvature extrema. Edge points found between curvature extrema (20) are then correlated with other edge points in previous scan lines to determine if they fall within a range of predicted line segments. Line segment data may then be processed at higher levels to identify objects in the data.

REFERENCES:
patent: 4545067 (1985-10-01), Juvin et al.
patent: 4566124 (1986-01-01), Yamamoto et al.
patent: 4771474 (1988-09-01), Takashima et al.
patent: 4876729 (1989-10-01), Watanabe et al.
"Theory of Edge Detection", by D. Marr and E. Hildreth, Proc. of the Royal Society of London, B 207, pp. 187-217, 1980.
"Linear Feature Extraction and Description", by R. Nevatia and K. R. Babu, Computer Graphics and Image Processing, vol. 13, pp. 257-269, 1980.
"On Detecting Edges", by V. S. Nalwa and T. O. Binford, IEEE Trans. on Pattern Analysis and Machine Intelligence, PAMI-8, No. 6, pp. 699-714, 1986.
"Digital Step Edges from Zero Crossing of Second Directional Derivatives", by R. M. Haralick, IEEE Trans. on Pattern Analysis and Machine Intelligence, PAMI-6, No. 1, pp. 58-68, 1984.
"A Computational Approach to Edge Detection", by J. Canny, IEEE Trans. on Pattern Analysis and Machine Intelligence, PAMI-8, No. 6, pp. 679-698, 1986.
"Detection, Localization, and Estimation of Edges", by J. S. Chen and G. Medioni, IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 11, No. 2, pp. 191-198, 1989.
"Object Detection Using Geometric Features", Dr. Robert H. Meyer and Kevin K. Tong, S.P.I.E. Conference Paper, Nov. 3, 1988.

Affiliated with

Also associated with

Rating

Apparatus and method for extracting edges and lines does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for extracting edges and lines, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for extracting edges and lines will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-546742