Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1989-05-10
1990-12-18
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324149, G01R 102, G01R 3100
Patent
active
049789074
ABSTRACT:
It has been found that the ground lead of a measurement instrument probe has an inductance which, when coupled with the capacitance of the rest of the probe, forms a resonant circuit. The net result is a peak in the frequency response of the probe which interferes with accurate amplitude measurements of test signals having a frequency above some threshold. Pursuant to the present invention, a resistor is added to the measurement instrument probe whose value substantially flattens the frequency response of the probe and permits accurate amplitude measurements over a substantially greater frequency range. This resistor, either having a fixed or adjustable value, can be added to the measurement instrument probe or can be included in an adjunct which fits over a probe end.
REFERENCES:
patent: 2883619 (1959-04-01), Kobbe et al.
patent: 3532982 (1970-10-01), Zeidlhack et al.
patent: 3612999 (1971-10-01), Bergero
patent: 4418314 (1983-11-01), Nieto, Jr.
AT&T Bell Laboratories
Eisenzopf Reinhard J.
Harvey Jack B.
Padnes David R.
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