Apparatus and method for estimating reflected radiance under...

Details Apparatus and method for estimating reflected radiance under... Apparatus and method for estimating reflected radiance under...

2006-08-15

2006-08-15

Nguyen, Kimbinh (Department: 2628)

Computer graphics processing and selective visual display system

Computer graphics processing

Three-dimension

Reexamination Certificate

active

07091973

ABSTRACT:
An apparatus and method for estimating reflected radiance under complex distant illumination are described. In one embodiment, an importance sampling estimator is used with a novel piecewise constant importance function that effectively concentrates ray samples where energy is likely to be found. To properly account for the effects of a visibility term in the shading calculation, in one embodiment, a shadow cache is provided which caches information indicating ray directions that are occluded or unoccluded from a point in space. Accordingly, by concentrating hemispheric samples where the light source is likely to be strongest, a reflected radiance integral is efficiently computed and estimated in a real-world lighting situation.

REFERENCES:
patent: 6697062 (2004-02-01), Cabral et al.
patent: 2003/0011596 (2003-01-01), Zhang et al.
patent: 2003/0128207 (2003-07-01), Sawada

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