Apparatus and method for elemental mass spectrometry

Details Apparatus and method for elemental mass spectrometry Apparatus and method for elemental mass spectrometry

2006-05-02

2006-05-02

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

C250S281000, C250S282000, C250S427000

Reexamination Certificate

active

07038199

ABSTRACT:
A mass spectrometer and method of mass spectrometry in which polyatomic and doubly charged ion interferences are attenuated by establishing an electron population through which a beam of particles containing elemental sample ions and the interfering ions is passed such that the interfering ions preferentially undergo ion-electron recombination and thus dissociation to remove a significant number of the interfering ions. Means (30or32) for providing a population of electrons (34or36) in an ICP-MS (22) may comprise a magnetic field means such as an electric coil, or an electron generating device. The population of electrons has an electron number density (>1011cm−3to 1014cm−3), a free electron energy (>0.01 eV to <5 eV) in a region at a low pressure (<10 Torr), such that for a predetermined path length (1–4 cm) of the ions through the electron population, the interfering ions will preferentially be attenuated by the dissociative recombination process. The ion beam (40) then passes to a mass analyser (42) and ions which have been separated according to their mass-to-charge ratio are detected by ion detector (44).

REFERENCES:
patent: 5256874 (1993-10-01), Chutjian
patent: 5514868 (1996-05-01), Dixon
patent: 6649907 (2003-11-01), Ebeling et al.
patent: 2004/0155180 (2004-08-01), Zubarev
patent: WO 02/078048 (2002-10-01), None

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