Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-12-06
2005-12-06
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S057000, C702S117000, C324S758010
Reexamination Certificate
active
06973406
ABSTRACT:
Apparatus for electrical testing of electrical circuits includes an array of probes arranged for selective engagement with portions of electrical circuits to be tested, testing circuitry associated with the array of probes for sensing electrical characteristics of the electrical circuits engaged by the array of probes, and control circuitry associated with the array of probes for causing engagement between selected ones of the array of probes with selected ones of the portions of electrical circuits to be tested. The array of probes includes at least two static probe assemblies arranged in a fixed array, and the static probe assemblies include a selectively positionable probe element and a probe element positioner. The apparatus is employed to test electrical circuits during fabrication.
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Harel Eyal
Zemer Dan
Orbotech Ltd.
Wachsman Hal
LandOfFree
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