Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-03-28
2006-03-28
Ramirez, Nestor (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07019549
ABSTRACT:
The invention includes a method and apparatus for electrical contact testing of LCD panels. In this invention the said system apparatus consists of a frame, x,y,z translation devices, a vision unit, a rotary direct drive mechanism for positioning, an integrated tester, LCD holding device, and a probe card. Electrical contact testing is achieved via:A LCD panel to be electrically tested is placed on the chuck and held down with vacuum.The x-y translation device then aligns the fixed substrate with the test head and probe card via a vision unit.The rotary mechanism corrects for any angular errors for accurate probe contact.Once aligned the probe device makes contact with the bond pads located on the panel.Electrical test signals are then sent from the integrated tester via probe card pins to measure storage capacitance to determine defects present in the panel.
REFERENCES:
patent: 6809544 (2004-10-01), Liao et al.
Fenwick & West LLP
Intersection Technologies Corporation
Nguyen Trung Q.
Ramirez Nestor
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