Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-03-08
1997-03-04
Gonzalez, Frank
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, 356 73, 356237, 356445, G01B 1130
Patent
active
056085273
ABSTRACT:
An apparatus for non-contact measuring of surface roughness, comprises a source of light positioned for directing a light beam at a first angle onto a surface to be measured, a segmented multi-element array detector positioned to receive specular light reflected from the surface by an intermediate segment and to receive scattered light very close to the specular light by adjacent segments, the intermediate segment responsive to generate a signal in response to the specular light, and the adjacent segments each responsive to generate a signal in response to the scattered light, a second detector spaced from the first detector and at an angle less than that of the first angle, the second detector responsive to scattered light away from the specular light for generating a signal responsive to the scattered light, and a processor for receiving and processing the signals and displaying a reading corresponding to surface roughness.
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Goebel David G.
Valliant James G.
Gonzalez Frank
Optical Dimensions, LLC
Ratliff Reginald A.
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