Apparatus and method for displaying wafer test results in real t

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364488, 364489, 364491, 364552, 371 17, 371 221, 371 291, G06F 1100

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active

053901312

ABSTRACT:
The invention is a method for displaying wafer test results from an integrated circuit tester in real time. The method comprising the steps of: (a) receiving wafer dimensions and die dimensions from a wafer handler; (b) creating a template representative of a wafer having cells representative of a die from the wafer dimensions and the die dimensions; (c) displaying the template; (d) invoking a tester to test a selected die of a selected wafer; (e) receiving test results from the tester; (f) displaying the test results on a selected cell which corresponds to the selected die; and (g) repeating steps (d)-(f) as required.

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