Apparatus and method for die attachment

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Including adhesive bonding step

Reexamination Certificate

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Details

C438S119000, C219S388000, C228S042000

Reexamination Certificate

active

06991967

ABSTRACT:
The invention provides an apparatus for die attachment onto a substrate including non-metallic material, and metallic material that is adapted to receive a die having a eutectic coating. A heating conduit is provided through which the substrate is movable for heating the metallic material to a eutectic bonding temperature to facilitate bonding between the die and the metallic material at a die-attach position. An induction heating device at the die-attach position heats the metallic material of the substrate to the eutectic bonding temperature prior to attaching a die onto the metallic material.

REFERENCES:
patent: 4359620 (1982-11-01), Keller
patent: 4938410 (1990-07-01), Kondo
patent: 4973826 (1990-11-01), Baudry et al.
patent: 4983804 (1991-01-01), Chan et al.
patent: 5409543 (1995-04-01), Panitz et al.
patent: 5573688 (1996-11-01), Chanasyk et al.
patent: 6135344 (2000-10-01), Sakuyama et al.
patent: 6288376 (2001-09-01), Tsumura
patent: 6386422 (2002-05-01), Cheng et al.
patent: 6608291 (2003-08-01), Collins et al.

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