Apparatus and method for determining the speed of a semiconducto

Details Apparatus and method for determining the speed of a semiconducto Apparatus and method for determining the speed of a semiconducto

1996-07-03

1998-10-06

Brock, Michael

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

438 18, 324765, G01R 31317

Patent

active

058182500

ABSTRACT:
A method of testing a speed of a semiconductor chip. A test time interval is specified. A test oscillator is fabricated as part of the semiconductor under test. The test oscillator contains elements that simulate a critical path of the semiconductor chip. Hence, the test oscillator's frequency is sensitive to process variations. The number of cycles of the oscillator occurring during the test time interval is counted. Based upon this count value, the speed of the semiconductor chip under test is determined.

REFERENCES:
patent: 4697140 (1987-09-01), Saito et al.
patent: 5039602 (1991-08-01), Merrill et al.
patent: 5099196 (1992-03-01), Longwell et al.
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5619463 (1997-04-01), Malhi

Affiliated with

Also associated with

Rating

Apparatus and method for determining the speed of a semiconducto does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for determining the speed of a semiconducto, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for determining the speed of a semiconducto will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-82340