Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-07-13
2009-06-16
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07548822
ABSTRACT:
Determining a slew rate of a signal from an integrated circuit under test by comparing the signal with a first reference voltage, comparing the signal with a second reference voltage different from the first reference voltage, generating an output pulse having a pulse width indicative of a slew rate of the signal, and integrating the output pulse over time to generate an output voltage proportional to the pulse width; wherein the output voltage is indicative of the slew rate of the signal produced by the integrated circuit.
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patent: 4612654 (1986-09-01), DeFreitas
patent: 6573767 (2003-06-01), Caldwell
patent: 6650174 (2003-11-01), Bell
patent: 6864731 (2005-03-01), Zumkehr
patent: 2004/0189363 (2004-09-01), Takano
patent: 2005/0201491 (2005-09-01), Wei
patent: 4225177 (1992-08-01), None
ESP, [online]; [retrieved on Jul. 12, 2007]; retrieved from the Internet http://v3.espacenet.com/textdoc?DB=EPODOC&IDX=JP4225177&F=0; Japanese Paten Abstract; “Measuring Apparatus for Slew Rate of Semiconductor Device”; Aug. 14, 1992; 1p; JP4225177, Japan.
Chuang Ching-Te K.
Ghosh Amlan
Kim Jae-Joon
Rao Rahul M.
Bui Bryan
Cantor & Colburn LLP
International Business Machines - Corporation
Perez-Pineiro Rafeal
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