Apparatus and method for determining the optical retardation of

Details Apparatus and method for determining the optical retardation of Apparatus and method for determining the optical retardation of

1998-03-31

1999-08-10

Font, Frank G.

Optics: measuring and testing

By polarized light examination

356369, 356371, G01J 400

Patent

active

059367350

ABSTRACT:
An apparatus for determining the optical retardation of a material. The apparatus includes a light source emitting light along a light path, and a lens disposed in the light path intermediate the light source and a sample of the material. A waveguide directs the light from the light source to the sample and directs light reflected from the sample to a wavelength analyzer, whereby the wavelength analyzer detects the wavelengths of the reflected light. The apparatus of the present invention includes a sole polarizing element disposed in the light path intermediate the light source and the wavelength analyzer.

REFERENCES:
patent: 4893932 (1990-01-01), Knollenberg
patent: 4909630 (1990-03-01), Gawrisch et al.
"Determination of Orientation in Thermotropic Liquid Crystalline Polymer Films by Spectrographic Measurement of the Birefringence" published in Macromolecules 1996, pp. 8726-8733.
FILMETRICS F20 "An Advanced Thin-Film Measurement System At A Breakthrough Price." published by FILMETRICS.
"Advanced Thin-Film Measurement Systems" published by FILMETRICS.

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