Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-03-20
2007-03-20
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C703S001000, C703S007000, C700S182000, C700S193000
Reexamination Certificate
active
11239764
ABSTRACT:
A method and apparatus for determining the minimum zone for an array of features with a true position tolerance. In one embodiment, a target function is defined according to a deviation value of each of at least two features from an array of features having a maximum deviation between an actual position and a nominal position. Once defined, the target function is minimized to determine a rotation parameter, a horizontal translation parameter and a vertical translation parameter that provide a minimum target function value as a minimum of the maximum deviation for the array of features. In one embodiment, an inspection report may be generated for the array of features, including at least the minimum, maximum deviation value, as well as the rotation parameter, the horizontal translation parameter and the vertical translation parameter that provide the minimum target function value. Other embodiments are described and claimed.
REFERENCES:
patent: 6507806 (2003-01-01), Tandler
Filatov Anatoly
Guderian Robert J.
Tuv Eugene
Barlow John
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Kundu Sujoy
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