Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1994-05-20
1995-05-16
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324613, 455 673, G01R 2700
Patent
active
054164222
ABSTRACT:
A single sideband noise figure of a device under test is determined from double sideband measurements. A noise measurement system is provided, which includes a noise source, a mixer, a local oscillator, and a tunable intermediate frequency receiver. Three independent measurements are performed (one with the local oscillator frequency on the high side of the RF measurement frequency, another with the local oscillator frequency on the low side of the RF measurement frequency, and the third with the local oscillator frequency at the RF measurement frequency and the intermediate frequency at twice its former frequency). These noise power measurements are combined in such a way as to cancel the unwanted sidebands. Preferably, three output noise power measurements are also performed during a calibration so that the subsequent measurements are corrected for impedance mismatch errors. The complexity and cost of performing accurate single sideband noise figure measurements are reduced compared to conventional single sideband measurement systems.
REFERENCES:
patent: 4998071 (1991-03-01), Strid et al.
patent: 5053714 (1991-10-01), Durand
patent: 5179344 (1993-01-01), Najle et al.
patent: 5191294 (1993-03-01), Grace et al.
Do Diep
Hewlett--Packard Company
Milks, III William C.
Wieder Kenneth A.
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