Apparatus and method for determining high temperature surface em

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374 9, 374130, 250339, G01N 2500

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052394883

ABSTRACT:
The apparatus and method permit simultaneous and precise determination of the temperature and spectral emittance, over a wide spectral region, of a hot sample. Radiance, and hemispherical reflectance and transmittance measurements are employed, and FT-IR technology is advantageously applied. Reflectance and (where necessary) transmittance measurements are utilized to determine the fraction of incident radiation, of selected wavelength, that is absorbed by the sample, in turn establishing a spectral emittance value. Taken with the measured radiance at the same wavelength, the spectral emittance value will provide a quantity that can be matched with the spectral radiance of a theoretical black body, again at the selected wavelength, to thereby derive the temperature of the hot sample; this in turn enables determination of the spectral emittance of the sample over a desired spectral range.

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