Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-08-02
2005-08-02
Wachsman, Hal D. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S121000, C324S765010
Reexamination Certificate
active
06925404
ABSTRACT:
An integrated circuit testing apparatus having at least two of a test circuit producing a signal for determining at least one of an operating reference signal and a substrate coupling effect on a plurality of components within the integrated circuit; a test circuit producing a signal for determining at least one of a cross-talk effect on the plurality of components and the accuracy of an interconnect capacitance extraction value; a test circuit producing a signal for determining at least one of an effect of system noise on the operational speed of the plurality of components and a maximum degradation expected for a logic path between the plurality of components; and a test circuit producing a signal for determining an effect of power supply noise on a signal propagation delay within the plurality of components.
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Micro)n Technology, Inc.
Thorp Reed & Armstrong LLP
Wachsman Hal D.
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