Optics: measuring and testing – Angle measuring or angular axial alignment
Reexamination Certificate
2006-09-19
2006-09-19
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Angle measuring or angular axial alignment
Reexamination Certificate
active
07110100
ABSTRACT:
An apparatus and method for determining an inclination angle θ between an axis of an elongate object such as a cane, a pointer or a jotting implement such as a pen, pencil, stylus or the like and a normal to a plane surface at times when a tip of the elongate object is contacting that plane surface. The apparatus has an emitter mounted on the object for illuminating the plane surface with a probe radiation at an angle σ with respect to the axis of the object. The apparatus also has a detector mounted on the elongate object for detecting a radiation characteristic of a scattered portion of the probe radiation returning from the plane surface and a computing unit for deriving the inclination angle θ from the radiation characteristic. A scanning arrangement, such as a uniaxial or biaxial scanner, or a light guiding optic can be used for varying angle σ, and the probe radiation can be emitted in the form of a scan beam. Preferably, the emitter and detector of the scattered portion of the probe radiation are integrated and the scattered portion of the probe radiation whose characteristic is being measured is the back-scattered portion. The radiation characteristic detected by the detector can be the intensity, polarization, time-of-flight or any combination thereof.
REFERENCES:
patent: 5166668 (1992-11-01), Aoyagi
patent: 5239489 (1993-08-01), Russell
patent: 5434371 (1995-07-01), Brooks
patent: 5764611 (1998-06-01), Watanabe
patent: 5786804 (1998-07-01), Gordon
patent: 5850058 (1998-12-01), Tano et al.
patent: 5902968 (1999-05-01), Sato et al.
patent: 5959617 (1999-09-01), Bird et al.
patent: 5977958 (1999-11-01), Baron et al.
patent: 5981884 (1999-11-01), Sato et al.
patent: 6023291 (2000-02-01), Kamel et al.
patent: 6033086 (2000-03-01), Bohn
patent: 6057909 (2000-05-01), Yahav et al.
patent: 6081261 (2000-06-01), Wolff
patent: 6181329 (2001-01-01), Stork et al.
patent: 6212296 (2001-04-01), Stork et al.
patent: 6249274 (2001-06-01), Teufel et al.
patent: 6323942 (2001-11-01), Bamji
patent: 6330057 (2001-12-01), Lederer et al.
patent: 6331911 (2001-12-01), Manassen et al.
patent: 6424407 (2002-07-01), Kinrot et al.
patent: 6449103 (2002-09-01), Charles
patent: 6492981 (2002-12-01), Stork et al.
patent: 6556190 (2003-04-01), Fleck et al.
patent: 6583866 (2003-06-01), Jung et al.
patent: 6592039 (2003-07-01), Smith et al.
patent: 6627870 (2003-09-01), Lapstun et al.
patent: 6650320 (2003-11-01), Zimmerman
patent: 6686579 (2004-02-01), Fagin et al.
patent: 2002/0001029 (2002-01-01), Abe
patent: 2002/0048404 (2002-04-01), Fahraeus et al.
patent: 2002/0141616 (2002-10-01), Cox et al.
patent: 2002/0148655 (2002-10-01), Cho et al.
patent: 2002/0180714 (2002-12-01), Duret
patent: 2003/0025951 (2003-02-01), Pollard et al.
patent: 2003/0029919 (2003-02-01), Lynggaard et al.
patent: 2003/0034961 (2003-02-01), Kao
patent: 2003/0063200 (2003-04-01), Isoyama
patent: 2003/0195820 (2003-10-01), Silverbrook et al.
patent: 2004/0231122 (2004-11-01), Sawyer et al.
Goldstein et al., Classical Mechanics, 3rd edition, Addison Wesley 2002, Chapters 4 & 5.
Schramm and Meyer, “Computer Graphic Simulation of Light Reflection from Paper”, IS&T Pics Conference, 1998, pp. 412-423.
Ait-Aider et al. “Adaptation of Lowe's Camera Pose Recovery Algorithm to Mobile Self-Localisation”, Robotica 2002.
Ait-Aider et al. “Model to Image Straight Line Matching Method for Vision-Based Indoor Mobile Robot Self-Location”, IROS 2002, Lausanne, Sep. 30-Oct. 4.
Ansar et al., “Linear Pose Estimation from Points of Lines”, ECCV 2002, LNCS 2353, pp. 282-296, 2002, Springer-Verlag Berlin Heidelberg 2002.
Batista et al., “Pose View Stability Analysis for Camera Look Angles Computation”, Institute of Systems and Robotics—Dep. of Elec. Engineering, Univ. of Coimbra, Portugal.
Schroering et al., “A New Input Device for 3D Sketching”, Washington University in St. Louis.
UDE, “Nonlinear Least Squares Optimisation of Unit Quatemion Functions for Pose Estimation from Corresponding Features”, Conf. Pattern Recognition, Brisbane, pp. 425-427 Aug. 1998.
Buermann Dale H.
Carl Stewart R.
Gonzalez-Banos Hector H.
Mandella Michael J.
Akanbi Isiaka O.
Electronic Scripting Products, Inc.
Lumen Intellectual Property Services Inc.
LandOfFree
Apparatus and method for determining an inclination of an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for determining an inclination of an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for determining an inclination of an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3573523