Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2011-06-28
2011-06-28
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S239800, C340S583000
Reexamination Certificate
active
07969566
ABSTRACT:
An apparatus for detection of the existence of a film on a surface comprises a lens, a light emitter and a light sensor. The light emitter is preferably disposed in spaced relation to the lens and is configured to emit light toward the lens such that the light is incident thereupon. The light sensor is also preferably disposed in spaced relation to the lens and is mounted adjacent to the light emitter. The light sensor is configured to measure light reflected back from the lens. The presence or absence on the film on the surface is based upon the amount (i.e., intensity) of light that is reflected back from the lens. The apparatus may further comprise a temperature sensor or atmospheric sensor for measuring a temperature of the lens and atmospheric conditions in order to determine whether conditions are appropriate for the formation of ice, frost and other frozen contaminants.
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Pham Hoa Q
The Boeing Company
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